基于单元分类的CMOL常开缺陷单元容错映射
PDF下载 (268)顾贤贵,夏银水.基于单元分类的CMOL常开缺陷单元容错映射[J].宁波大学学报(理工版),2020,33(1):51-57.DOI:
GU Xiangui,XIA Yinshui.Cell classification based CMOL stuck-at-open defect-tolerant cell mapping[J].Journal of Ningbo University(Natural Science & Engineering Edition),2020,33(1):51-57.DOI:
| Title: | Cell classification based CMOL stuck-at-open defect-tolerant cell mapping |
| 作者: | 顾贤贵, 夏银水 |
| Author(s): | GU Xiangui, XIA Yinshui |
| 关键词: | 进化算法; 单元容错映射 |
| Keywords: | CMOL; evolutionary algorithm; defect-tolerant cell mapping |
| 分类号: | TP391.41 |
| 文献标识码: | A |
| 摘要: | CMOS纳米分子混合电路(CMOS/nanowire/MOLeclular hybrid circuits, CMOL)在制造过程中会引入较高缺陷率, 从而导致可用映射资源的减少. 针对由此产生的映射困难问题, 本文采用单元分类思想, 对部分缺陷单元加以利用, 以增加可映射单元数, 进而提高映射成功率. 首先根据单元缺陷类型的差异, 将缺陷单元分为可用和不可用两类进行标记, 然后对可用缺陷单元加以利用, 并采用改进的进化算法完成单元容错映射. 实验结果表明, 与已有方法相比, 新方法在运行效率和成功率上分别得到了19.17%和30.14%的提升. |
| Abstract: | To tackle the problem of high defect rate in CMOS/nanowire/MOLeclular hybrid circuits (CMOL), a cell classification based defect-tolerant cell mapping method is proposed. First, recoverable and unrecoverable defective cells are marked, and the recoverable defective ones are put to use again. Then, a modified evolutionary algorithm is used to complete the defect-tolerant cell mapping. Compared with the existing approaches, the CPU time and success rate using the proposed method are optimized to 19.17% and 30.14%, respectively. |
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| 备注/Memo: | 收稿日期: 2019－07－22. 宁波大学学报（理工版）网址: http://journallg.nbu.edu.cn/ 基金项目: 国家自然科学基金（61571248）. 第一作者: 顾贤贵（1995－）, 男, 浙江宁波人, 在读硕士研究生, 主要研究方向: 逻辑电路综合与优化. E-mail: 1014406105@qq.com *通信作者: 夏银水（1963－）, 男, 浙江余姚人, 研究员, 主要研究方向: 集成电路综合与优化. E-mail: xiayinshui@nbu.edu.cn 宁波大学学报（理工版）网址：http://journallg.nbu.edu.cn/ |
